Refractive index of WO3 thin films grown under various temperatures determined by the Swanepoel method
I. Tirca, I. Boerasu, M. Radu, Mariana Osiac
Topics & Concepts
Materials scienceRefractive indexScanning electron microscopeThin filmSubstrate (aquarium)DiffractionDeposition (geology)Analytical Chemistry (journal)OpticsTransmission electron microscopyBand gapOptoelectronicsNanotechnologyChemistryComposite materialChromatographyBiologyPhysicsPaleontologyOceanographyGeologySedimentTransition Metal Oxide NanomaterialsGas Sensing Nanomaterials and SensorsSurface Roughness and Optical Measurements