Litcius/Paper detail

Comparative investigation of Artificial Neural Network (ANN) and Response Surface Methodology (RSM) expectation in EDM parameters

S. Ganapathy, P. Balasubramanian, B. Vasanth, S. Thulasiraman

2020Materials Today Proceedings26 citationsDOI

Topics & Concepts

Response surface methodologyMean squared errorArtificial neural networkMachiningElectrical discharge machiningCorrelation coefficientDesign of experimentsCoefficient of determinationRoot mean squareMachine learningEngineeringMathematicsComputer scienceStatisticsMechanical engineeringElectrical engineeringAdvanced Machining and Optimization TechniquesAdvanced machining processes and optimizationIndustrial Vision Systems and Defect Detection