Multiphysics modeling of SOFC performance degradation caused by interface delamination and active layer cracking
Tao Yang, Yueying Fan, Jian Liu, Harry O. Finklea, Shiwoo Lee, Bo Guan, Harry Abernathy, Thomas Kalapos, Gregory Hackett
Topics & Concepts
MultiphysicsMaterials scienceDelamination (geology)Degradation (telecommunications)CrackingElectrolyteComposite materialSolid oxide fuel cellConstant currentElectrodePolarization (electrochemistry)VoltageFinite element methodComputer scienceStructural engineeringElectrical engineeringChemistryPaleontologyPhysical chemistryTelecommunicationsTectonicsSubductionBiologyEngineeringAdvancements in Solid Oxide Fuel CellsSemiconductor materials and devicesElectronic and Structural Properties of Oxides