Automated defect detection of insulated gate bipolar transistor based on computed laminography imaging
Yan Li, Shuangquan Liu, Chunmiao Li, Yushuang Zheng, Cunfeng Wei, Baodong Liu, Yao Yang
Topics & Concepts
SegmentationSolderingVoid (composites)WeldingBipolar junction transistorTransistorEnhanced Data Rates for GSM EvolutionMaterials scienceComputer scienceLayer (electronics)Artificial intelligenceElectronic engineeringElectrical engineeringEngineeringComposite materialMetallurgyVoltageAdvancements in Photolithography TechniquesIndustrial Vision Systems and Defect DetectionSilicon Carbide Semiconductor Technologies