Reliability analysis of composite insulators subject to multiple dependent competing failure processes with shock duration and shock damage self-recovery
Xuefeng Kong, Jun Yang
Topics & Concepts
Reliability (semiconductor)Shock (circulatory)Failure mechanismReliability engineeringComposite numberDegradation (telecommunications)Electric shockMechanism (biology)Process (computing)Duration (music)Structural engineeringComputer scienceEngineeringForensic engineeringMaterials scienceMechanical engineeringComposite materialPhysicsThermodynamicsElectronic engineeringQuantum mechanicsMedicineOperating systemInternal medicineAcousticsPower (physics)High voltage insulation and dielectric phenomenaProbabilistic and Robust Engineering DesignConcrete Corrosion and Durability