Characterisation of small embedded two-dimensional defects using multi-view Total Focusing Method imaging algorithm
Nicolas Budyn, Anthony J. Croxford, Rhodri L. T. Bevan, Jie Zhang, Paul D. Wilcox
Topics & Concepts
AlgorithmProbabilistic logicLimit (mathematics)AmplitudeComputer scienceBayesian probabilityNondestructive testingDiffractionArtificial intelligenceOpticsMathematicsPhysicsMathematical analysisQuantum mechanicsUltrasonics and Acoustic Wave PropagationNon-Destructive Testing TechniquesGeophysical Methods and Applications