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Influence of Mo interlayers on the microstructure of layers and reflective characteristics of Ru/Be multilayer mirrors

R. M. Smertin, Н. И. Чхало, М. Н. Дроздов, С. А. Гарахин, S. Yu. Zuev, В. Н. Полковников, Н. Н. Салащенко, P. A. Yunin

2022Optics Express15 citationsDOIOpen Access PDF

Abstract

The influence of Mo interlayers on the microstructure of films and boundaries, and the reflective characteristics of Ru/Be multilayer mirrors (MLM) were studied by X-ray reflectometry and diffractometry, and secondary ion mass spectrometry (SIMS). An increase in the reflection coefficients of MLM at a wavelength of 11.4 nm to record values of R = 72.2% and FWHM to Δλ 1/2 = 0.38 nm is shown. The effect of interlayers on the structural and reflective characteristics of MLM is explained by the barrier properties of the Mo layers, which prevent the mutual mixing of the Ru and Be layers, which leads to the formation of beryllides and a decrease in the X-ray optical contrast at the boundaries.

Topics & Concepts

MicrostructureMaterials scienceReflectometryOpticsReflection (computer programming)WavelengthFull width at half maximumReflection coefficientThin filmTotal internal reflectionAnalytical Chemistry (journal)OptoelectronicsComposite materialNanotechnologyChemistryChromatographyPhysicsComputer scienceComputer visionTime domainProgramming languageMagnetic properties of thin filmsHigh-pressure geophysics and materialsIon-surface interactions and analysis
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