Quantitative phase imaging with a compact meta-microscope
Junyi Wang, Rongtao Yu, Xin Ye, Jiacheng Sun, Jian Li, Chunyu Huang, Xingjian Xiao, Jitao Ji, Wenjing Shen, Zuoxiu Tie, Chen Chen, Shining Zhu, Tao Li
Abstract
Abstract Quantitative phase imaging (QPI) based on the transport-of-intensity equation (TIE) is a powerful technique in label-free microscopy. The image stack required for a successful TIE-QPI is traditionally obtained by translating the object or image plane, and the optical elements used in the conventional TIE-QPI systems are usually bulky and cumbersome. Stable and compact TIE-QPI methods capable of non-motion optical zooming can significantly facilitate applications that demand portability. Here, we propose a non-motion TIE-QPI method based on a dispersive metalens. The dispersive nature of the metalens is utilized to provide a spectral focal tuning. With fixed object and image planes, seven through-focus intensity images are captured by changing the illumination wavelength. The QPI performance is validated by retrieving the surface phase profiles of a microlens array and a phase resolution target, showing a high phase detection accuracy (deviation less than 0.03 wavelength). Subsequently, we established a compact meta-microscope by integrating the metalens with a commercially available CMOS image sensor, which shows good performance in microscopic imaging of unstained bio-samples. Our approach, based on the large-dispersive metalens, facilitates a compact and robust QPI system for optical metrology and label-free microscopy.