Simulation study on single-event burnout in field-plated Ga2O3 MOSFETs
Chenghao Yu, Haomin Guo, Yan Liu, Xiaodong Wu, Li-long Zhang, Xin Tan, Yun-cheng Han, Lei Ren
Topics & Concepts
Materials scienceElectric fieldEnhanced Data Rates for GSM EvolutionOptoelectronicsJoule heatingVoltageOxideMOSFETGate oxideLeakage (economics)Threshold voltageTransistorElectrical engineeringElectronic engineeringComposite materialMetallurgyEngineeringPhysicsTelecommunicationsMacroeconomicsQuantum mechanicsEconomicsGa2O3 and related materialsSemiconductor materials and devicesElectronic and Structural Properties of Oxides