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In situ damage characterization of CFRP under compression using high-speed optical, infrared and synchrotron X-ray phase-contrast imaging

Nazanin Pournoori, Guilherme Corrêa Soares, Bratislav Lukić, Matti Isakov, Maria Clara Lessa Belone, Mikko Hokka, Mikko Kanerva

2023Composites Part A Applied Science and Manufacturing15 citationsDOIOpen Access PDF

Abstract

The strain rate dependency and failure modes of carbon fiber reinforced plastic (CFRP) laminate were investigated under out-of-plane compressive loading. Simultaneous high-speed optical and infrared imaging were used to measure full-field deformation and temperature in the dynamically loaded specimens. The damage initiation and propagation inside the CFRP laminates at high strain rates were characterized using in-situ ultra-fast synchrotron X-ray phase contrast imaging (XPCI). The visually observed damage onset occurs at the strain value of 4.2±0.6% as transverse shear fracture at the free edge of specimens. The local temperature increases significantly to 185 °C due to damage initiation at high strain rates, while at low strain rate the temperature rise occurs along the final shear band. The XPCI and post-failure analysis provide an integrated perspective on the formation of a diagonal shear crack and disintegration of the specimen into two pieces with the fracture of plies in the in-plane transverse direction. Electron microscopic (SEM) study was integrated with XPCI results to append the time scale for the post-mortem failure pattern as well as the length scale for microcracks and filament-level failure.

Topics & Concepts

Materials scienceComposite materialSynchrotronStrain rateDeformation (meteorology)Transverse planeShear (geology)Field emission gunFracture (geology)Scanning electron microscopeOpticsStructural engineeringPhysicsEngineeringMechanical Behavior of CompositesIntegrated Circuits and Semiconductor Failure AnalysisOptical measurement and interference techniques
In situ damage characterization of CFRP under compression using high-speed optical, infrared and synchrotron X-ray phase-contrast imaging | Litcius