Litcius/Paper detail

Revolutionizing Fe doped back barrier AlGaN/GaN HEMTs: Unveiling the remarkable 1700V breakdown voltage milestone

I. V. Binola K Jebalin, S. Angen Franklin, G. Gifta, P. Prajoon, D. Nirmal

2024Microelectronics Journal16 citationsDOI

Topics & Concepts

Materials scienceHigh-electron-mobility transistorOptoelectronicsGallium nitrideBreakdown voltageBarrier layerDopingElectric fieldWide-bandgap semiconductorSubstrate (aquarium)NitrideVoltageLayer (electronics)TransistorEngineering physicsElectrical engineeringNanotechnologyEngineeringQuantum mechanicsGeologyPhysicsOceanographyGaN-based semiconductor devices and materialsSemiconductor materials and devicesSilicon Carbide Semiconductor Technologies
Revolutionizing Fe doped back barrier AlGaN/GaN HEMTs: Unveiling the remarkable 1700V breakdown voltage milestone | Litcius