Residue-level error detection in cryoelectron microscopy models
Gabriella Reggiano, Wolfgang Lugmayr, Daniel P. Farrell, Thomas C. Marlovits, Frank DiMaio
Topics & Concepts
Computer sciencePrecision and recallArtificial intelligenceDeep learningResolution (logic)Low resolutionMicroscopySet (abstract data type)Cryo-electron microscopyAlgorithmMachine learningHigh resolutionPattern recognition (psychology)Biological systemBiologyBiophysicsPhysicsOpticsRemote sensingGeologyProgramming languageAdvanced Electron Microscopy Techniques and ApplicationsRNA and protein synthesis mechanismsRNA modifications and cancer