A novel failure time estimation method for degradation analysis based on general nonlinear Wiener processes
Ao Zhang, Zhihua Wang, Rui Bao, Chengrui Liu, Qiong Wu, Shihao Cao
Topics & Concepts
Nonlinear systemReliability (semiconductor)Series (stratigraphy)TangentWiener processDegradation (telecommunications)Distribution (mathematics)Computer scienceMathematical optimizationApplied mathematicsAlgorithmMathematicsMathematical analysisGeometryBiologyTelecommunicationsQuantum mechanicsPower (physics)PaleontologyPhysicsReliability and Maintenance OptimizationFatigue and fracture mechanicsProbabilistic and Robust Engineering Design