6000 lines/mm blazed grating for a high-resolution x-ray spectrometer
Dmitriy L. Voronov, Seo‐Young Park, Eric M. Gullikson, F. Salmassi, H. A. Padmore
Abstract
We have designed and fabricated a high groove density blazed grating for a Resonant Inelastic X-ray Scattering spectrometer for the new Qerlin beamline at the Advanced Light Source (ALS) synchrotron facility. The gratings were fabricated using a set of nanofabrication techniques including e-beam lithography, nanoimprint, plasma etch, and anisotropic wet etching. Two gratings with groove density of 6000 lines/mm and 3000 lines/mm and optimized for operation in the 1 st and 2 nd negative diffraction order respectively were fabricated and tested. We report on fabrication details and characterization of the gratings at beamline 6.3.2 of the ALS.
Topics & Concepts
BeamlineOpticsMaterials scienceGratingSpectrometerNanoimprint lithographyNanolithographyDiffraction gratingSynchrotronLithographyFabricationOptoelectronicsElectron-beam lithographyX-ray lithographyResistBeam (structure)PhysicsNanotechnologyLayer (electronics)PathologyAlternative medicineMedicineAdvanced X-ray Imaging TechniquesX-ray Spectroscopy and Fluorescence AnalysisCrystallography and Radiation Phenomena