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Improved Drain Current Characteristics of HfO2/SiO2 Dual Material Dual Gate Extension on Drain Side-TFET

B. Balaji, K. Srinivasa Rao, K. Girija Sravani, B. Kalivaraprasad, N. V. Bindu Madhav, K. Chandrahas, B.R.B Jaswanth

2022Silicon26 citationsDOI

Topics & Concepts

Materials scienceOptoelectronicsSilicon carbideSiliconDielectricSubstrate (aquarium)Gate oxideTransistorGate dielectricSilicon nitrideQuantum tunnellingHigh-κ dielectricMOSFETNitrideVoltageNanotechnologyElectrical engineeringLayer (electronics)Composite materialGeologyOceanographyEngineeringAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis
Improved Drain Current Characteristics of HfO2/SiO2 Dual Material Dual Gate Extension on Drain Side-TFET | Litcius