Advancing the application of atomic force microscopy (AFM) to the characterization and quantification of geological material properties
Ke Wang, Kevin G. Taylor, Lin Ma
Topics & Concepts
Characterization (materials science)Atomic force microscopyNanotechnologyNanoscopic scaleMaterials scienceRaman spectroscopyPhysicsOpticsHigh-pressure geophysics and materialsForce Microscopy Techniques and ApplicationsHydrocarbon exploration and reservoir analysis