Simultaneous measurement of layer thicknesses in thin layered materials using the phase of ultrasonic reflection coefficient spectrum
Xiangwei Geng, Chengcheng Zhang, Jian Zhang, Guoqiang Luo, Qiang Shen
Topics & Concepts
Ultrasonic sensorMaterials scienceReflection coefficientAcousticsBandwidth (computing)TransducerOpticsReflection (computer programming)Thin layersLayer (electronics)OptoelectronicsComposite materialComputer scienceTelecommunicationsPhysicsProgramming languageUltrasonics and Acoustic Wave PropagationNon-Destructive Testing TechniquesAcoustic Wave Resonator Technologies