Variable angle spectroscopic ellipsometry characterization of spin-coated MoS2 films
Grazia Giuseppina Politano, Marco Castriota, Maria Penelope De Santo, Mario Michele Pipita, Giovanni Desiderio, Carlo Vena, C. Versacé
Topics & Concepts
Molybdenum disulfideEllipsometryMaterials scienceSpin coatingRaman spectroscopyExfoliation jointCharacterization (materials science)PhotonicsThin filmOptoelectronicsNanotechnologyOpticsGrapheneComposite materialPhysics2D Materials and ApplicationsChalcogenide Semiconductor Thin FilmsPerovskite Materials and Applications