Total ionizing dose and single event effect response of 22 nm ultra-thin body and buried oxide fully depleted silicon-on-insulator technology
Yanan Yin, Han Ma, Qiwen Zheng, Jiawei Chen, Xinpei Duan, Pingwei Zhang, Xinjie Zhou
Topics & Concepts
Silicon on insulatorStatic random-access memoryOptoelectronicsAbsorbed doseMaterials scienceTransistorThreshold voltageIrradiationSingle event upsetBiasingElectrical engineeringVoltageSiliconPhysicsEngineeringNuclear physicsRadiation Effects in ElectronicsSemiconductor materials and devicesVLSI and Analog Circuit Testing