FIT: Inspect vulnerabilities in cross-architecture firmware by deep learning and bipartite matching
Hongliang Liang, Zhuosi Xie, Yixiu Chen, Hua Ning, Jian-Li Wang
Topics & Concepts
FirmwareComputer scienceBipartite graphCode (set theory)Matching (statistics)Vulnerability (computing)Artificial intelligenceTheoretical computer scienceGraphComputer securityProgramming languageOperating systemMathematicsStatisticsSet (abstract data type)Advanced Malware Detection TechniquesSoftware Testing and Debugging TechniquesSoftware Engineering Research