Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process
Bokai Zheng, Cen Chen, Yigang Lin, Yifan Hu, Xuerong Ye, Guofu Zhai, Enrico Zio
Topics & Concepts
Reliability (semiconductor)Test planRobustness (evolution)Degradation (telecommunications)Optimal designNonlinear systemDesign of experimentsReliability engineeringProcess (computing)Wiener processComputer scienceMathematical optimizationEngineeringMathematicsStatisticsMachine learningWeibull distributionGeneQuantum mechanicsOperating systemPhysicsBiochemistryPower (physics)TelecommunicationsChemistryReliability and Maintenance OptimizationProbabilistic and Robust Engineering DesignAdvanced Battery Technologies Research