Annealing-induced characterization of sputtered V2O5 thin films and Ag/V2O5/p-Si heterojunctions
B. Aljawrneh, Yusuf Selim Ocak, Borhan Albiss
Topics & Concepts
Thin filmMaterials scienceAnnealing (glass)CrystalliteScanning electron microscopeBand gapHeterojunctionSputteringSiliconAnalytical Chemistry (journal)OptoelectronicsNanotechnologyChemistryComposite materialMetallurgyChromatographyTransition Metal Oxide NanomaterialsZnO doping and propertiesGa2O3 and related materials