Interfacial defect mediated charge carrier trapping and recombination dynamics in TiO2-based nanoheterojunctions
Yuan Wang, Junyu Li, Yun Zhou, Zhao Gao, Wenjun Zhu, Lixin Liu
Topics & Concepts
TrappingCharge carrierUltrafast laser spectroscopyElectronHeterojunctionMaterials sciencePhotoluminescenceCarrier lifetimeRecombinationChemical physicsOptoelectronicsCarrier generation and recombinationMolecular physicsSpectroscopyChemistrySemiconductorPhysicsBiologyGeneEcologyBiochemistryQuantum mechanicsSiliconAdvanced Photocatalysis TechniquesElectronic and Structural Properties of OxidesQuantum Dots Synthesis And Properties