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Characterization and removal of contaminants in lithography

Yawen Gao, Changsheng Chen, Feng Wang, Mingbo Li, Chao Sun

2025Science China Physics Mechanics and Astronomy17 citationsDOI

Topics & Concepts

Characterization (materials science)LithographyContaminationNanotechnologyExtreme ultraviolet lithographyEnvironmental scienceMaterials scienceEnvironmental chemistryChemistryOptoelectronicsBiologyEcologyRecycling and Waste Management TechniquesElectrohydrodynamics and Fluid DynamicsAdditive Manufacturing and 3D Printing Technologies
Characterization and removal of contaminants in lithography | Litcius