Synchrotron X-ray topography characterization of high quality ammonothermal-grown gallium nitride substrates
Yafei Liu, Balaji Raghothamachar, Hongyu Peng, Tuerxun Ailihumaer, Michael Dudley, Ramón Collazo, James Tweedie, Zlatko Sitar, F. Shahedipour‐Sandvik, Kenneth A. Jones, Andrew Armstrong, Andrew A. Allerman, Karolina Grabiańska, Robert Kucharski, Michał Boćkowski
Topics & Concepts
SynchrotronMaterials scienceWaferGallium nitrideDislocationCrystallographyBurgers vectorNitrideOpticsSubstrate (aquarium)OptoelectronicsNanotechnologyChemistryComposite materialLayer (electronics)PhysicsOceanographyGeologyGaN-based semiconductor devices and materialsSilicon Carbide Semiconductor TechnologiesMetal and Thin Film Mechanics