Anodized titanium oxide thickness estimation with ellipsometry, reflectance spectra extrema positions and electronic imaging: importance of the interfaces electromagnetic phase-shift
Quentin Cridling, Renée Charrière, Damien Jamon, Matthieu Lenci, MariaPia Pedeferri, D. Delafosse
Topics & Concepts
OxideEllipsometryMaterials scienceRefractive indexTitanium oxideAnodizingSpectral linePhase (matter)Thin filmOpticsAnalytical Chemistry (journal)OptoelectronicsChemistryNanotechnologyComposite materialMetallurgyPhysicsAluminiumAstronomyOrganic chemistryChromatographyAnodic Oxide Films and NanostructuresCorrosion Behavior and InhibitionConcrete Corrosion and Durability