Litcius/Paper detail

Critical analysis of adhesion work measurements from AFM-based techniques for soft contact

Dmitrii Sychev, Simon Schubotz, Quinn A. Besford, Andreas Fery, Günter K. Auernhammer

2023Journal of Colloid and Interface Science20 citationsDOI

Topics & Concepts

Atomic force microscopyAdhesionNanotechnologyMaterials scienceSoft materialsContact angleWork (physics)Composite materialMechanical engineeringEngineeringPolymer Surface Interaction StudiesForce Microscopy Techniques and ApplicationsAdhesion, Friction, and Surface Interactions
Critical analysis of adhesion work measurements from AFM-based techniques for soft contact | Litcius