Development of large size crystal growth technology of oxide eutectic scintillator and a proto-type Talbot–Lau imaging system
Kei Kamada, Hiroaki Yamaguchi, Nobuhiro Yasui, Ryota Ohashi, Toru Den, Kyoung Jin Kim, Masao Yoshino, Akihiro Yamaji, Shunsuke Kurosawa, Yasuhiro Shoji, Yuui Yokota, Vladimir V. Kochurikhin, Akira Yoshikawa
Abstract
Abstract Wafers of Tb-doped GdAlO 3 / α -Al 2 O 3 eutectic were fabricated by the micro-pulling-down method using an Ir crucible with a 25 × 25 mm 2 die. A prototype X-ray phase imaging detector was developed using a CMOS sensor with a fiber optic plate and the eutectic wafer. X-ray spots with an 8.24 μ m period were observed using the detector. X-ray phase imaging of a nylon ball with a diameter of 4 mm was also carried out. It was observed that a phase change of approximately 2 μ m occurs at the air–nylon interface. This technique of X-ray phase imaging can be realized in the absence of an absorption grating.