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Highly linear sub-nanoradian tilt measurement based on dual-beam interferometry

Hao Yan, Qiuli Mao, Siyuan Xie, Shuai Liu, Jun Luo, Hsien‐Chi Yeh

2020Optics Letters24 citationsDOI

Abstract

The tilt measurement method based on dual-beam interferometry is presented in this Letter. Due to symmetric property of the nonlinear errors of two displacement measurement arms, the composite nonlinearity of the tilt measurement is counterbalanced, so that a small nonlinearity over a large dynamic range can be obtained. According to the theoretical analysis with a Gaussian beam model, the second-order nonlinear error is dominant. The experimental results show that a measurement noise of <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:mn>0</mml:mn> <mml:mo>.</mml:mo> <mml:mn>4</mml:mn> <mml:mspace width="thickmathspace"/> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mi mathvariant="normal">n</mml:mi> <mml:mi mathvariant="normal">r</mml:mi> <mml:mi mathvariant="normal">a</mml:mi> <mml:mi mathvariant="normal">d</mml:mi> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mo>/</mml:mo> </mml:mrow> </mml:mrow> <mml:msqrt> <mml:mi mathvariant="normal">H</mml:mi> <mml:mi mathvariant="normal">z</mml:mi> </mml:msqrt> </mml:math> at 1 Hz with a nonlinearity of less than 60 nrad for a measurement range of <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:mo>±</mml:mo> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mn>500</mml:mn> </mml:mrow> <mml:mspace width="thickmathspace"/> <mml:mtext>µ</mml:mtext> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mi mathvariant="normal">r</mml:mi> <mml:mi mathvariant="normal">a</mml:mi> <mml:mi mathvariant="normal">d</mml:mi> </mml:mrow> </mml:math> has been achieved.

Topics & Concepts

OpticsTilt (camera)InterferometryPhysicsNonlinear systemDisplacement (psychology)Observational errorBeam (structure)Noise (video)Range (aeronautics)Materials scienceComputer scienceMathematicsPsychologyStatisticsImage (mathematics)Quantum mechanicsGeometryPsychotherapistComposite materialArtificial intelligenceOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesAdvanced Fiber Optic Sensors
Highly linear sub-nanoradian tilt measurement based on dual-beam interferometry | Litcius