Litcius/Paper detail

LM-CNN: A Cloud-Edge Collaborative Method for Adaptive Fault Diagnosis With Label Sampling Space Enlarging

Lei Ren, Zidi Jia, Tao Wang, Yehan Ma, Lihui Wang

2022IEEE Transactions on Industrial Informatics46 citationsDOI

Abstract

In cloud manufacturing systems, fault diagnosis is essential for ensuring stable manufacturing processes. The most crucial performance indicators of fault diagnosis models are generalization and accuracy. An urgent problem is the lack and imbalance of fault data. To address this issue, in this article, most of existing approaches demand the label of faults as <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">a priori</i> knowledge and require extensive target fault data. These approaches may also ignore the heterogeneity of various equipment. We propose a cloud-edge collaborative method for adaptive fault diagnosis with label sampling space enlarging, named label-split multiple-inputs convolutional neural network, in cloud manufacturing. First, a multiattribute cooperative representation-based fault label sampling space enlarging approach is proposed to extend the variety of diagnosable faults. Besides, a multi-input multi-output data augmentation method with label-coupling weighted sampling is developed. In addition, a cloud-edge collaborative adaptation approach for fault diagnosis for scene-specific equipment in cloud manufacturing system is proposed. Experiments demonstrate the effectiveness and accuracy of our method.

Topics & Concepts

Cloud computingComputer scienceFault (geology)Enhanced Data Rates for GSM EvolutionData miningSampling (signal processing)Convolutional neural networkCloud manufacturingRepresentation (politics)Adaptive samplingDistributed computingArtificial intelligenceGeneralizationReal-time computingMachine learningMathematicsComputer visionFilter (signal processing)Operating systemGeologyMathematical analysisMonte Carlo methodPolitical sciencePoliticsStatisticsSeismologyLawIndustrial Vision Systems and Defect DetectionFault Detection and Control SystemsDigital Transformation in Industry