KPFM visualisation of the Schottky barrier at the interface between gold nanoparticles and silicon
Luis Lechaptois, Yoann Prado, Olivier Pluchery
Abstract
was measured. Kelvin Probe Force Microscopy (KPFM) is used to measure the contact potential differences (CPD). The CPD images exhibit a ring-shaped pattern ("doughnut-shape") centred on each AuNP. The built-in potential is measured at +34 mV for n-doped substrates and it decreased to +21 mV for p-doped silicon. These effects are discussed using the classical electrostatic approach.
Topics & Concepts
Materials scienceSchottky barrierInterface (matter)NanotechnologySiliconColloidal goldNanoparticleVisualizationOptoelectronicsComputer scienceComposite materialWettingDiodeArtificial intelligenceSessile drop techniqueSemiconductor materials and interfacesForce Microscopy Techniques and ApplicationsSurface and Thin Film Phenomena