Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET
Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar, Navjeet Bagga
Topics & Concepts
Materials scienceTrap (plumbing)NanosheetSubthreshold conductionOptoelectronicsReliability (semiconductor)Threshold voltageCMOSSubthreshold slopeIonVoltageAnalytical Chemistry (journal)Electrical engineeringTransistorNanotechnologyChemistryPower (physics)PhysicsEngineeringMeteorologyChromatographyOrganic chemistryQuantum mechanicsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignFerroelectric and Negative Capacitance Devices