Automatic fabric defect detection using a wide-and-light network
Jun Wu, Juan Le, Zhitao Xiao, Fang Zhang, Lei Geng, Yanbei Liu, Wen Wang
Topics & Concepts
Computer scienceBottleneckKernel (algebra)Convolution (computer science)Feature (linguistics)Feature extractionArtificial intelligencePattern recognition (psychology)AlgorithmComputer visionEmbedded systemArtificial neural networkCombinatoricsPhilosophyLinguisticsMathematicsIndustrial Vision Systems and Defect DetectionImage Processing Techniques and ApplicationsImage Enhancement Techniques