Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts
Vitor A. P. Aguiar, Saulo G. Alberton, Matheus S. Pereira
Abstract
Radiation effects on electronic devices represent a major concern in applications for harsh environments, such as aerospace and nuclear facilities. This article presents a review of fundamental aspects of radiation effects on semiconductors, with a primary focus on Single-Event Effects. It discusses charge collection models, destructive effects, applications in detectors, and impacts on digital devices, drawing from recent research findings.
Topics & Concepts
Reliability (semiconductor)Event (particle physics)Reliability engineeringSemiconductor deviceRadiationEnvironmental sciencePhysicsEngineeringMaterials scienceNanotechnologyOpticsQuantum mechanicsLayer (electronics)Power (physics)Radiation Effects in ElectronicsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit Design