How to Kill the Second Bird with One ECC: The Pursuit of Row Hammer Resilient DRAM
Michael Jaemin Kim, Minbok Wi, Jaehyun Park, Seoyoung Ko, Jaeyoung Choi, Hwayoung Nam, Nam Sung Kim, Jung Ho Ahn, Eojin Lee
Abstract
Error-correcting code (ECC) has been widely used in DRAM-based memory systems to address the exacerbating random errors following the fabrication process scaling. However, ECCs including the strong form of Chipkill have not been so effective against Row Hammer (RH), which incurs bursts of errors discretely corrupting the whole row beyond the ECC correction capability.
Topics & Concepts
DramDynamic random-access memoryComputer scienceParallel computingScalingRandom access memoryProcess (computing)Error detection and correctionCode (set theory)FabricationLook-aheadArithmeticComputer hardwareAlgorithmOperating systemProgramming languageMathematicsSemiconductor memoryGeometryAlternative medicineSet (abstract data type)PathologyMedicineVLSI and Analog Circuit TestingRadiation Effects in ElectronicsLow-power high-performance VLSI design