Numerical Simulation of Enhanced-Reliability Filleted-Gate AlGaN/GaN HEMT
Ashok K Ray, Sushanta Bordoloi, Biplab Sarkar, Pratima Agarwal, Gaurav Trivedi
Topics & Concepts
High-electron-mobility transistorReliability (semiconductor)OptoelectronicsSolid-state physicsMaterials scienceGallium nitrideElectrical engineeringEngineeringPhysicsTransistorCondensed matter physicsComposite materialPower (physics)Quantum mechanicsVoltageLayer (electronics)GaN-based semiconductor devices and materialsSemiconductor Quantum Structures and DevicesSilicon Carbide Semiconductor Technologies