Litcius/Paper detail

Application of deuterium oxide (D2O) isotope tracing technique for encapsulated QFN failure analysis

Liao Jinzhi Lois, Tian Meng, Yong Du, Qiang Ji, Lei Zhu, Xi Zhang, Younan Hua, Xiaomin Li

2022Microelectronics Reliability13 citationsDOI

Topics & Concepts

Quad Flat No-leads packageLeakage (economics)Materials scienceMoisturePolymerDeuteriumOxideComposite materialNuclear engineeringForensic engineeringMetallurgyEngineeringNuclear physicsAdhesiveEconomicsLayer (electronics)PhysicsMacroeconomicsElectrostatic Discharge in ElectronicsNuclear Physics and ApplicationsHigh voltage insulation and dielectric phenomena