The structural and electronic properties of Carbon-related point defects on 4H-SiC (0001) surface
Shengsheng Wei, Zhipeng Yin, Jiao Bai, Weiwei Xie, Fuwen Qin, Yan Su, Dejun Wang
Topics & Concepts
Materials scienceCrystallographic defectVacancy defectCarbon fibersEpitaxyLattice (music)Electronic structureFrenkel defectSchottky defectBand gapChemical physicsMolecular physicsCondensed matter physicsCrystallographyComputational chemistryNanotechnologyOptoelectronicsComposite materialChemistrySchottky diodePhysicsAcousticsLayer (electronics)DiodeComposite numberSilicon Carbide Semiconductor TechnologiesGraphene research and applicationsDiamond and Carbon-based Materials Research