Infrared HOT material systems vs. Law 19 paradigm
Antoni Rogalski, M. Kopytko, Feng Dai, Ruiqi Jiang, Fang Wang, Weida Hu, Piotr Martyniuk
Topics & Concepts
LawEngineeringComputer sciencePolitical scienceAdvanced Semiconductor Detectors and MaterialsInfrared Target Detection MethodologiesCalibration and Measurement Techniques