Litcius/Paper detail

In-situ investigation of interlayer interface bonding defect-formation mechanisms during FRAM

Yangyang Xu, Haibin Liu, Ruishan Xie, Ying Chen, Dawei Guo, Shujun Chen

2025International Journal of Mechanical Sciences9 citationsDOI

Topics & Concepts

In situMaterials scienceInterface (matter)Composite materialCrystallographyChemistryCapillary actionCapillary numberOrganic chemistryAdvanced Welding Techniques AnalysisWelding Techniques and Residual StressesAdditive Manufacturing Materials and Processes
In-situ investigation of interlayer interface bonding defect-formation mechanisms during FRAM | Litcius