AFM characterization of cellulose nanocrystal height and width using internal calibration standards
Maohui Chen, Jérémie Parot, Vincent A. Hackley, Shan Zou, Linda J. Johnston
Topics & Concepts
RADIUSMaterials scienceNanocrystalCalibrationTransmission electron microscopyRange (aeronautics)Atomic force microscopyCharacterization (materials science)NanoparticleCross section (physics)NanotechnologyAnalytical Chemistry (journal)Composite materialChemistryPhysicsComputer securityComputer scienceChromatographyQuantum mechanicsAdvanced Cellulose Research StudiesLignin and Wood ChemistryPolysaccharides and Plant Cell Walls