Investigations of short-circuit failure in double trench SiC MOSFETs through three-dimensional electro-thermal-mechanical stress analysis
Kailun Yao, Hiroshi Yano, Noriyuki Iwamuro
Topics & Concepts
Materials scienceTrenchStress (linguistics)Bipolar junction transistorThermal runawayMOSFETTransient (computer programming)Dielectric strengthOptoelectronicsTransistorDielectricElectrical engineeringComposite materialEngineeringPower (physics)VoltageComputer scienceLayer (electronics)Quantum mechanicsOperating systemLinguisticsPhysicsBattery (electricity)PhilosophySilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesAdvanced ceramic materials synthesis