Hi’Beam-S: A Monolithic Silicon Pixel Sensor-Based Prototype Particle Tracking System for HIAF
Haibo Yang, Honglin Zhang, Chaosong Gao, H. Wang, Xiangming Sun, Jun Liu, Shen Wang, Xianqin Li, Weiping Ren, Wei Zhou, Rui He, Yuezhao Zhang, Jianwei Liao, Sihan Zhu, Y. Lu, X. Y. Niu, Jian‐Hua Guo, Chengxin Zhao
Abstract
Particle tracking systems, which function either as particle detectors or beam monitors, are the critical elements for the high-intensity heavy-ion accelerator facility (HIAF) complex. The novel Topmetal-M pixel sensor, which combines the features of both monolithic active pixel sensor (MAPS) and the Topmetal sensor, can be used either for a pixel detector or a nondestructive beam monitor. The Topmetal got its name as some part of the pixel’s top metal layer is exposed to sense the drifting charge. In this article, a prototype particle tracking system, named Hi’Beam-S, has been designed to characterize the Topmetal-M sensor. The laser test shows a spatial resolution of <inline-formula> <tex-math notation="LaTeX">$\sim 9 ~\mu \text{m}$ </tex-math></inline-formula> for the laser spot measurement. The heavy-ion beam test demonstrates that, for a 5-mm track with a ~20° incident angle, a spatial resolution of <inline-formula> <tex-math notation="LaTeX">$\sim 1.59 ~\mu \text{m}$ </tex-math></inline-formula> could be achieved.