Comprehensive characterization of efficiency limiting defects in the swirl-shaped region of Czochralski silicon
Zijing Wang, Xiaodong Zhu, Shuai Yuan, Xuegong Yu, Deren Yang
Topics & Concepts
SiliconMaterials scienceDeep-level transient spectroscopyWaferOptoelectronicsSolar cellScanning electron microscopeQuantum efficiencyCarrier lifetimeBand gapAnnealing (glass)Analytical Chemistry (journal)ChemistryComposite materialChromatographySilicon and Solar Cell TechnologiesThin-Film Transistor TechnologiesSilicon Nanostructures and Photoluminescence