Evaluation of classification models in limited data scenarios with application to additive manufacturing
Farhad Pourkamali‐Anaraki, Tahamina Nasrin, Robert E. Jensen, Amy M. Peterson, Christopher J. Hansen
Topics & Concepts
Computer scienceBenchmark (surveying)Sampling (signal processing)EstimatorAdaptive samplingSelection (genetic algorithm)Data miningTest dataMachine learningStatisticsMonte Carlo methodMathematicsGeodesyGeographyProgramming languageComputer visionFilter (signal processing)Machine Learning and AlgorithmsDomain Adaptation and Few-Shot LearningAdversarial Robustness in Machine Learning