Development of Simulation Prediction Techniques for Low Frequency Emissions
Yanwen Lai, Yirui Yang, Zhedong Ma, Qinghui Huang, Shuo Wang, Zheng Luo
Abstract
Electromagnetic interference (EMI) has become an increasingly important issue in high-speed and high-power density power electronics applications. At low frequencies below 30 MHz, conducted emission and radiated emission are regulated by international standards such as CISPR 25. However, EMI tests usually require specified experiment setups, and it is time-consuming. It is desired for device manufacturers to develop prediction techniques that can simplify the prediction process and provide accurate prediction results based on analysis and simulation basis. This paper develops the LF EMI prediction models for conducted and radiated EMI. The prediction results are validated by experiments.