Prospect of making XPS a high-throughput analytical method illustrated for a Cu<sub><i>x</i></sub>Ni<sub>1−<i>x</i></sub>O<sub><i>y</i></sub> combinatorial material library
Lucas C. W. Bodenstein-Dresler, Adi Kama, Johannes Frisch, Claudia Hartmann, Anat Itzhak, Regan G. Wilks, David Cahen, Marcus Bär
Abstract
, areas on the sample where sudden composition changes have been identified) for detailed XPS characterization. Together with the envisioned improvements when going from laboratory to synchrotron-based excitation sources, this will shorten the analysis time sufficiently for XPS to become a realistic characterization option for combinatorial material science.
Topics & Concepts
X-ray photoelectron spectroscopyCharacterization (materials science)ThroughputSynchrotronComputer scienceChemistryMaterials scienceComputational scienceAnalytical Chemistry (journal)NanotechnologyPhysicsNuclear magnetic resonanceOpticsEnvironmental chemistryTelecommunicationsWirelessElectronic and Structural Properties of OxidesCopper-based nanomaterials and applicationsCatalytic Processes in Materials Science