A reliability demonstration test plan derivation method based on subsystem test data
Ping Jiang, Qian Zhao, Hui Xiao, Bo Wang, Yunyan Xing
Topics & Concepts
Test planReliability engineeringReliability (semiconductor)Test (biology)Test dataPlan (archaeology)Computer scienceTest methodEngineeringStatisticsMathematicsWeibull distributionPaleontologyHistoryQuantum mechanicsProgramming languageArchaeologyBiologyPower (physics)PhysicsReliability and Maintenance OptimizationSoftware Reliability and Analysis ResearchRisk and Safety Analysis