Gate stack engineering of two-dimensional transistors
Yeon Ho Kim, Donghun Lee, Woong Huh, Jaeho Lee, Donghyun Lee, Gunuk Wang, Jaehyun Park, Daewon Ha, Chul‐Ho Lee
Topics & Concepts
Key (lock)Stack (abstract data type)Benchmark (surveying)TransistorElectrical engineeringComputer scienceBenchmarkingElectronic engineeringEngineeringMetal gateGate dielectricLogic gateSet (abstract data type)SiliconEmerging technologiesChannel (broadcasting)FabricationNanoelectronicsElectronicsScalingHigh-κ dielectricMOSFETAdvancements in Semiconductor Devices and Circuit DesignFerroelectric and Negative Capacitance DevicesSemiconductor materials and devices