Examining slit pore widths within plasma-exfoliated graphitic material utilising Barrett–Joyner–Halenda analysis
Rachel L. McLaren, Christian J. Laycock, Emmanuel Brousseau, Gareth R. Owen
Abstract
BJH analysis is shown to be a highly useful method to estimate the distance between stacks within plasma-exfoliated graphitic material, and is shown to coincide with data obtained from SEM, AFM and XRD analysis.
Topics & Concepts
ChemistryPlasmaSlitNanotechnologyChemical physicsCrystallographyOpticsPhysicsMaterials scienceQuantum mechanicsGraphene research and applicationsIon-surface interactions and analysisHigh voltage insulation and dielectric phenomena